共找到 150 條與 TEM法 相關的標準，共 10 頁
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Notice on Printing and Distributing "Technical Specifications for Inspection and Evaluation of Health Foods" (2003 Edition)
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Notice on Printing and Distributing Test Methods for Determination of Benzoyl Peroxide in Flour and Oil
本部分規(guī)定了在電信設備內(nèi)部通過TEM小室和寬帶TEM小室方法進行輻射發(fā)射測量的方法 本部分適用于工作頻率范圍為150kHz～1GHz的電信設備內(nèi)部的集成電路
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 2:Measurement of Radiated Emissions TEM Cell and Wideband TEM Cell Method
GB/T33014 的本部分規(guī)定了電氣/電子部件對連續(xù)罕帶輻射電騷擾的抗擾試驗方法 ————模電磁波(CTEM)小室法。 本部分適用于M.N.O、世類車輛(不限定車輛動力系統(tǒng),例如火花點火發(fā)動機、柴油發(fā)動機、電型機7用電氣/電子部件
Road vehicles—Component test methods for electrical/electronic disturbances from narrowband radiated electromagnetic energy—Part 3: Transverse electromagnetic（TEM）cell
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated
Measurement of Radiated Emissions From Integrated Circuits-Tem/Wideband Tem (Gtem) Cell Method; Tem Cell (150 Khz to 1 Ghz), Wideband Tem Cell (150 Khz to 8 Ghz)
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated
Measurement of Radiated Emissions from Integrated CircuitsTEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated
Measurement of Radiated Emissions from Integrated Circuits TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
Focus groups: Working methods and procedures Grupos Tem醫(yī)icos: M閠odos y procedimientos de trabajo
SAME AS IEC 62132-2
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)
