共找到 150 條與 X射線衍射法 相關(guān)的標(biāo)準(zhǔn)，共 10 頁(yè)
Riguarda la progettazione e l' uso delle apparecchiature per analisi di diffrattometria e fluorescenza a raggi X (nel seguito denominate
Radiation safety for x-ray diffraction and fluorescence analysis equipment.
X-ray Diffraction Based Residual Stress Measurements
This test method covers the preparation and use of a flat stress-free test specimen for the purpose of checking the systematic error caused
Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
Solid waste attribute identification method - Phase identification - X-ray diffraction method
Errata corrige 1 del 24-09-2009 alla UNI EN 15305:2008
Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
Determination of residual stress in metallic materials by short wavelength X-ray diffraction
本標(biāo)準(zhǔn)規(guī)定了應(yīng)用X射線衍射技術(shù)對(duì)伊利石/蒙皂石間層礦物識(shí)別及其間層比的計(jì)算方法。 本標(biāo)準(zhǔn)適用于沉積巖樣品中伊利石/蒙皂石間層礦物的鑒定
X-ray Diffraction Identification Method of Illite/Smectite Interlayer Minerals
Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
この規(guī)格は，X線回折裝置を用いて回折X線を測(cè)定 し，これによって物質(zhì)の同定?定量，格子定數(shù)の精密測(cè)定，結(jié)晶化度の測(cè)定などを行う場(chǎng)合の一般的事項(xiàng)について規(guī)定する
General rules for X-ray diffractometric analysis
本標(biāo)準(zhǔn)描述了用于X射線光譜色散的衍射光柵。特別關(guān)注反射型光柵。大多數(shù)結(jié)果同樣適用于透射型光柵。只有在不適用的情況下，透射光柵才會(huì)單獨(dú)處理。X射線光學(xué)系統(tǒng)的術(shù)語(yǔ)和定義在VDI/VDE 5575第1部分中規(guī)定
X-ray optical systems - Part 10: Diffraction gratings
