DIN 50451-3:2003
半導體工藝用材料測試.液體中痕量元素測定.第3部分:用電感耦合等離子體質譜法測定硝酸中鋁(AL)、鈷(Co)、銅(Cu)、鈉(Na)、鎳(Ni)和鋅(Zn)的含量
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), cobalt (Co), copper (Cu), sodium (Na), nickel (Ni) and zinc (Zn) in nitric acid by ICP-MS